Dual-Scanner Automated Acoustic Imaging for High-Throughput Inspection
Product Overview
The AMI DF2400 C-SAM is a high-performance, dual-scanner automated acoustic imaging system designed for rapid, non-destructive inspection of electronic components in JEDEC trays or modules. Equipped with FACTS2 automation, the DF2400 delivers 2x to 7x higher throughput than previous models, while preserving image quality and diagnostic precision.
Using proprietary WaterPlume scanning, Visual PolyGate, and Sonolytics software, it simultaneously scans two trays or modules while drying components in a separate zone—maximizing efficiency for inline or standalone quality control. From semiconductor packages and power modules to advanced composites and assemblies, the DF2400 delivers industry-leading resolution and defect detection capabilities.
Key Features
- Dual-scanner system with inertially balanced linear motors for fast, vibration-free scanning
- Simultaneous scanning and drying of two trays/modules
- Visual PolyGate with Probing-Gate™ for multi-depth acoustic imaging
- AutoScan™ automation for focus, alignment, and analysis
- Advanced scan modes: C-, A-, B-, Interface-, Bulk-, LoBE, Thru-Scan™, STaR™, TDI™
- Water management system with filtration, degassing, heating, and UV disinfection
- DIA software with automatic accept/reject analysis
- JEDEC tray and Auer boat compatibility
- Cleanroom-ready, CE and SEMI S2/S8 compliant
- Optional Vacuum Hold-down, SEMI F47 UPS, and heated drying
Specifications
| Feature | Specification |
|---|---|
| Scanning Configuration | Dual scanner with independent regions |
| Max Scan Area (Each Scanner) | Up to standard JEDEC tray size |
| Resolution | Up to 286 MP (16K) acoustic data points |
| Transducer Range | 50 MHz to 400 MHz (up to 230 MHz recommended) |
| Pulser/Receiver Bandwidth | 500 MHz |
| Gain Control | 95 dB, adjustable in 0.5 dB steps |
| Water Management | Dual WaterPlume™ scanning, recirculation, UV, heater |
| Imaging Modes | C-Scan, A-Scan, B-Scan, Interface, LoBE, Thru-Scan™, STaR™ |
| Automation Software | Sonolytics™ for Windows 7 with AutoScan™, DIA, Multi-language |
| Pass/Fail Tools | Automated defect % analysis with MIL-STD criteria |
| Air Requirement | 32 CFM @ 80 PSI clean/dry air |
| DI Water Requirement | 23 L recirculation tank @ 20 PSI inlet |
| Power Supply | 220–240 VAC, Single Phase, 15 A base (up to 80 A max) |
| System Dimensions (L × W × H) | 2.48 × 0.94 × 2.26 m (97.4" × 37" × 88.8") |
| System Weight | Approx. 500 kg (1,100 lbs) |
| Cleanroom Compliance | ISO Cleanroom Ready, ESD-safe surfaces |
| Factory Automation Support | SECS/GEM E30, SMEMA, SEMI F47 UPS (optional) |
Applications
Semiconductors & Advanced Packaging
- Inspection of BGAs, QFNs, flip chips, and leadframe packages
- Bond line analysis and delamination detection in die attach layers
- JEDEC tray batch inspection with automatic sorting
Consumer Electronics & Contract Manufacturing
- High-volume inspection of devices assembled in trays or boats
- Pass/fail sorting and traceability for OEM/ODM QA environments
Resources
Please complete the form and we will be in contact as soon as possible.