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The semiconductor industry includes the design and fabrication of semiconductors and semiconductor devices, such as transistors and integrated circuits. 

The fabrication process normally divided into several steps, Wafer fabrication, frontend process, and backend process. It is highly sophisticated and the requirement if very stringent every step throughout the manufacturing processes. 

Core Solutions
Supermini200
X-ray Fluorescence | WDXRF & TXRF
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XtaLAB Synergy-ED
Single Crystal Electron Diffractometer | SC-ED
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Proforma 300i
Wafer Thickness Measurement
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Rigaku-STA8122-Thermo-Plus-EVO2
Thermal Analysis Systems | TA
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Nordson 4000plus
Bond Tester
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Rigaku XRD
X-ray Diffractometer | XRD
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Insidix TDM
Topography & Deformation Measurement
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Imina Probing
Nanoprobing SEM Solution
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XRTMicron
X-ray Topography Imaging System
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Manual X-Ray Inspection
Manual X-Ray Inspection
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Nordson AOI M2 Automated Optical Inspection System
Automated Optical Inspection Systems | AOI
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Nordson X Series
Automated X-Ray Inspection | AXI
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Wafer Surface Analysis, Surface Contamination Identification (cleanliness) Using Contact Angle Measurement
Wafer Surface Analysis, Surface Contamination Identification (cleanliness) Using Contact Angle Measurement
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UltraMap UMA-C200 System
Non Contact Full Wafer Thickness Scanning Metrology
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semiconductor-metrology-system
Critical Wafer Metrology For Very Thin Wafers, Bumped Wafers, Mounted Wafers
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AST VCA 3000S Wafer Surface Analysis
Water Surface Analysis, Surface Contamination Identification (Cleanliness) Using Contact Angle Measurement
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FT200 Series
XRF Coating Thickness Analyzer
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Sonoscan Gen 7
Automated and Stand Alone Scanning Acoustic Microscope

Automated and Standalone Scanning Acoustic Microscope (SAM) solution offers high-precision, non-destructive imaging for a variety of materials and components.

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Fuild Dispensing
Fluid Dispensing Solution
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Nordson AP Batch Series
Plasma Treatment Systems
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Nordson FlexTrak
Advanced Plasma Cleaning Systems
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